The transition to multi-Gigabit serial data links introduces significant signal integrity design and system challenges for clock/PLL designers. At these high data rates, signal integrity becomes the most critical test for determining overall performance and interoperability. Wavecrest instruments have offered high-speed test capabilities to design engineers for over 10 years. This experience enables us to provide you with all the diagnostic tools for applications including:

• Clock characterization
• Oscillator
• PLL
• Fan-out

By increasing our reliance on PLL devices, we must learn better ways to debug, characterize and test our synchronous systems.
The Wavecrest SIA-3600C is uniquely qualified to debug, characterize and test PLL devices. The SIA-3600C combines high precision measurement and advanced analysis algorithms with high throughput to provide the most comprehensive PLL analysis solution on the market today.

The SIA-3600C can measure every critical characteristic of a PLL device including random and deterministic jitter, periodic jitter, adjacent cycle jitter, duty cycle, slew rate, voltage characteristics and PLL loop response.

The SIA-3600C provides both timing and amplitude compliance measurements in any environment, system or IC, electrical or optical**. Clock signals up to 6GHz can be analyzed.

It is the most comprehensive diagnostic signal integrity test solution on the market today. The SIA-3600C comes complete with the software necessary for serial data analysis and also has powerful software for characterizing Clocks and PLL outputs.

Click here for the 3600 data sheet.