Wavecrest Corporation - Jitter Analysis and Signal Integrity Solutions
 
 



The transition to multi-Gigabit serial data links introduces significant signal integrity design and system challenges for clock/PLL designers. At these high data rates, signal integrity becomes the most critical test for determining overall performance and interoperability. Wavecrest instruments have offered high-speed test capabilities to design engineers for over 10 years. This experience enables us to provide you with all the diagnostic tools for applications including:

Clcok characterization
PLL characterization
• Oscillator
• Fan-out

By increasing our reliance on PLL devices, we must learn better ways to debug, characterize and test our synchronous systems. The Wavecrest SIA-3400C is uniquely qualified to debug, characterize and test PLL devices. The SIA-3400C combines high precision measurement and advanced analysis algorithms with high throughput to provide the most comprehensive PLL analysis solution on the market today.

The SIA-3400C can measure every critical characteristic of a PLL device including random and deterministic jitter, periodic jitter, adjacent cycle jitter, duty cycle, slew rate, voltage characteristics and PLL loop response.



 

 

 

 

The SIA-3400C provides both timing and amplitude compliance measurements in any environment, system or IC, electrical or optical**. Clock signals up to 3.5GHz can be analyzed. Compliance tests can be completed in seconds with a simple pass/fail indication for each test parameter.

It is the most comprehensive compliance and diagnostic signal integrity test solution on the market today. The SIA-3400C comes complete with the software necessary for characterizing Clocks and PLL outputs.

 

 

 

 

 

Click here for 3400 Data Sheet

Specifications
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2, 4 or 5 channels

 

**Optical measurements require the OE-2

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