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Enhance Speed, Throughput and Accuracy
With One Powerful Instrument
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Every day, clock speeds get faster and data rates increase.
This relentless acceleration makes signal integrity and flawless
operation increasingly difficult to achieve—in the lab
or on the production floor. In fact, test engineers and production
managers can no longer rely solely on conventional test equipment
and expect fast, accurate, repeatable results.
That's why we developed the SIA-3000, the reference standard
for signal integrity analysis. This powerful test and measurement
solution—together with a suite of advanced, application-specific
software and accessories—enables design and test engineers
to fully characterize devices faster and easier than ever
before.
When you put the SIA-3000 to work, you will see these
immediate benefits:
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Test up to 10 channels in parallel — Unlike any
other instrument available today, the SIA-3000 can test multiple
channels for jitter and accuracy at the same time.
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Input signal rates up to 3GHz or 4.5gb/s —Measure
signal integrity at data rates up to 4.5 Gb/s with 200 femtosecond
resolution enabling testing of faster channels and more accurate
jitter measurements.
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Enhanced throughput — Delivers unprecedented
speed of test, allowing designers, integrators and test engineers
to fully characterize complex communication paths in record time.
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Integrated display and proven Wavecrest advanced analysis
tools - The built-in flat panel display provides
access to an intuitive GUI with scope-like usability.
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Flexible, modular configuration — Configure the
SIA-3000 depending on your needs. Choose the combination the
best suits your needs for throughput and measurement rate.
Options and upgrades can be added easily if your requirements
change.
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Ensure signal integrity in multiple applications —
The SIA-3000 has a wide range of application specific
capabilities including:
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Infiniband - Test to compliance on all channels
simultaneously at speeds up to 4.5Gb/s per channel.
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Rambus DRCG - Perform full DRCG validation in
seconds.
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Fibre Channel and Gigabit Ethernet - Test to compliance
on all patterns and all channels simultaneously.
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DDR SRAM - Fully Characterize the data bus timing
performance and Wide Bus BER.
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Microprocessor - Optimize clock and data timing
using advanced WAVECREST algorithms for
Wide Bus BER.
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DVI/TMDS/LVDS- Characterize all data and clock
channels of the interface for timing, jitter, skew
rate, signal integrity and BER at the same time.
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Serial ATA - Fully diagnose signal-degenerating
effects such and crosstalk, EMI, Gaussian noise and reference
clock stability.
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Clock Distribution and PLL - Measure all types
of jitter, including adjacent cycle jitter, signal integrity
and short cycle probability, all in one solution.
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LAN - Test BER and waveform fidelity, as well
as analyze signal integrity, on all signals simultaneously.
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SONET - Diagnose complex jitter problems on multi-port
SONET switches and transceivers.
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XAUI - Test to compliance on all patterns and
all channels simultaneously, at speeds up to 4.5Gb/s.
Continue to check back for more
application specific details.
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Timing Characteristics:
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Maximum frequency
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3GHz
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Maximum data rate
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4.5Gb/s
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Wideband jitter noise floor
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< 3ps (2ps typical)
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True hardware
one-shot resolution
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200fs
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