Winner of the “Best in Test” award from Test & Measurement World, the WAVECREST DTS-2075 provides the picosecond accuracy, femtosecond resolution, low noise floor and high-speed needed for the rapid characterization of semiconductor devices in the time, frequency and modulation domains.

The DTS-2075 helps design and characterization engineers fully analyze all aspects of jitter and other critical timing parameters of high frequency clocks and data communication devices, including pulse width, phase, propagation delays, rise and fall times, and period and frequency jitter components.

Operating either synchronously or asynchronously, the DTS-2075 is ideal for both stand alone benchtop operation and integration into ATE systems for use in production. The DTS-2075 permits 100% correlation of characterization and final test by directly supporting both applications.

Timing Characteristics:

Frequency Range

0.4Hz to 800MHz

Maximum Data Rate

1.3Gbps

Minimum Pulse Width

625ps

Jitter Noise Floor

< 6ps rms (3ps rms typical at cal frequency) ⁽¹⁾

Jitter Measurement Accuracy

< 2ps ⁽²⁾

Hardware Resolution

800fs

Time Measurement Range

±2.5s

Frequency Measurement Range

1PPM

Time Base Accuracy

1PPM

Time Base Stability (Short Term Aging)

5x10-11

Voltage Performance:

Input Range

±1.1V

VREF Accuracy

±(1.0 mV+0.05% of setting)

VREF Resolution

150µV