Low Voltage Differential Signaling (LVDS) is quickly becoming a popular standard for high- speed, low power data transfer for a wide variety of applications such as display graphics, inside the box busses, and other high speed, low power data transfer applications.

As bus speeds have increased jitter has become a crucial performance parameter. As a result it has become increasingly important to characterize the jitter and other critical timing parameters of these systems and components.

Wavecrest products are ideal for debugging and testing LVDS components and systems because of their ability to analyze all components of jitter on clock and data signals.

Wavecrest provides the following
measurement solutions for LVDS:

Measure clock-to-data jitter on bus type LVDS systems (up to 9 data channels with one clock channel in parallel)

Measure clock and data jitter in seconds to 10-12 BER

Measure clock and data jitter on up to ten channels in parallel

Separate Total Jitter (TJ) into Random Jitter (RJ) and Deterministic Jitter (DJ)

Measure channel-to-channel skew

Measure Clock Rise and Fall times