TF - MP2, A 3 Hour Tech Forum http://www.designcon.com/2007/conference/tf_mp2.html

Recent Developments in Jitter and Signal Integrity Measurement and Analysis
Monday, January 29 | 1:30 pm - 4:30 pm

Technical Panel http://www.designcon.com/2007/conference/tec_panel_monday.html

Jitter and Its Challenges When Testing Receivers Used in Serial Data Designs
Monday, January 29 | 4:45 pm - 6:00 pm

8-TA3
http://www.designcon.com/2007/conference/8_ta3.html

Simultaneous Jitter Analysis in Time, Frequency, and Statistical Domains and Their Interrelationships
Tuesday, January 30 | 10:15 am - 10:55 am

13-TP2
A Generic and Higher Order Model for High-Speed Test Interface Analysis and De-emedding (white paper - 450KB)

A Generic and Higher Order Model for High-Speed Test Interface Analysis and De-embedding (DesignCon2007 - PowerPoint - 430KB)

http://www.designcon.com/2007/conference/13_tp2.html
Tuesday, January 30 | 2:50 pm - 3:30 pm