New Product Release

October 3, 2000

Atlantic City, October 3 - WAVECREST Corporation announced today at ITC the release of the TEMplusä Test Enhancement Module, providing the capability to test LAN 100Base-T/1000Base-T devices on existing ATE test systems. The new product represents a significant advancement in testing the emerging technologies of Fibre Channel, Gigabit Ethernet, SERDES, SONET, Firewire 1394B, and FAST PLL clocks-embedded devices in a production environment and can be utilized to characterize output jitter to ANSI specification.

The TEMplus consists of a WAVECREST DTS™ Communications Signal Analyzer, Arbitrary Waveform Generator Programmable Source, High Bandwidth Matrix, ATE Cable Card, and an installation kit with new API software. Optional configurations of the TEMplus are also available.

The expansion of TEM products greatly enhances any existing ATE system and, with plug and play production solutions, extends the investment cycle of the ATE. The addition of analog and mixed-signal measurements creates standardization of the production test environment and the compact, mobile system design quickly and easily integrates with older generation production test equipment.

"The heart of our ATE solution is the DTS Accumulated Time Analyzer™," said Dennis Leisz, WAVECREST President & CEO. "Our technology, which has earned a prominent place in the design characterization labs of many of the industry's' most prominent manufacturers, is now gaining popularity as a final test solution. Please join WAVECREST at ITC, booth number 1143, as we showcase our latest innovation."

WAVECREST Corporation provides innovative and leading edge electronic test and measurement products for the design and production of electronic and photonic components and systems. WAVECREST signal integrity, jitter and timing analysis solutions are widely used to measure, diagnose and test diverse applications including PLL, Fibre Channel, Gigabit Ethernet and fiber optical devices/systems.