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For Immediate Release

January 29, 2001

Contact:
Wavecrest Sales
mnordvall@wavecrest.com
WAVECREST Corporation
(952) 831-0030
(800) 733-7128

DesignCon Attendees Preview the Wavecrest SIA-3000:
A New Reference Standard for Signal Integrity Analysis

San Jose, January 29 - WAVECREST is previewing the SIA-3000 today at DesignCon. An all-in-one test and measurement instrument with high bandwidth and versatile parallel channel support, the SIA-3000 is a new reference standard for signal integrity analysis.

"The SIA-3000 delivers the functionality of an oscilloscope, bit error rate (BER) tester and time interval analyzer, plus other enhanced features," said Dennis J. Leisz, president and CEO of WAVECREST. "The SIA-3000 will enable design engineers and production test engineers to reduce the time-to-market for new products through this high precision and high throughput measurement technology."

The SIA-3000 delivers a wide range of application-specific features for datacom, telecom, microprocessor manufacturing and other high-tech industries. Applications include Infiniband, Fibre Channel, Gigabit Ethernet, Serial ATA, RAMBUS RIMM and DRCG validation, DDR SRAM, DVI/LVDS/TMDS, Clocks/PLL, SONET and XAUI.

The SIA-3000 provides a host of advanced features, including:

· Complete signal integrity solution: The SIA-3000 performs a wide variety of measurements on data or clock signals including jitter, adjacent cycle jitter, skew, BER, pulse width, rise and fall times, propagation delays and phase noise. It also determines the effects of EMI, crosstalk and frequency modulation
· 10 parallel channels: Unlike any other instrument available today, the SIA-3000 can test up to 10 channels for jitter and accuracy at the same time. It measures signal integrity on 10 user-switchable, single-ended or differential, fully parallel channels. This significantly speeds up testing and helps simplify test setup.
· High performance: The SIA-3000 measures signal integrity at data rates up to 4.5 Gb/s with 200 femtosecond resolution. This enables faster testing of channels, more accurate jitter measurements and practical large sample testing.
· Enhanced throughput: Unprecedented speed of test allows designers, integrators and test engineers to fully characterize complex communication paths in record time.
· Integrated, easy-to-use design: A built-in flat panel display provides access to an intuitive GUI with scope-like usability. Integrated analysis software-and the hardware to run it-eliminates the need for a separate PC.
· Modular configuration: Users can specify from 4 to 10 channel cards, depending on their needs for throughput and measurement rate. Options and upgrades can be added easily when requirements change.

WAVECREST provides innovative and leading-edge electronic test and measurement products for the design and production of electronic and photonic components and systems. WAVECREST signal integrity, jitter and timing analysis solutions are widely used to measure, diagnose and test diverse applications. For more information visit www.wavecrest.com or call Mark Nordvall, Director of Sales at 1.800.733.7128.

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